Symposium F6. Advanced Characterization for Materials Genome & ICME: Synchrotron X-ray & Neutron
|E-Wen Huang||National Yang Ming Chiao Tung University|
|Yan-Gu Lin||National Synchrotron Radiation Research Center|
|Cheng-Ying Chen||Ming Chi University of Technology|
|Che-Yi Chu||National Chung Hsing University|
Scope & Topics
The emergent property of materials originates in mesoscale complexity and the feature of structures and dynamics in the range from nanometer to micrometer is a common interest in materials research. Synchrotron X-ray and neutron techniques with improved probes and advanced detectors provide unprecedented opportunities to satisfy the emerging research needs in materials science. Recently, both in situ synchrotron X-ray and neutron techniques (e.g., imaging, scattering, and spectroscopy) have been employed to study the structural and chemical evolution of functional materials in real time and in operating environments with spatial resolution down to the atomic scale. Correlative information obtained from such in situ techniques has enabled new insights into materials transformation mechanisms. This symposium aims to bring together researchers from materials science, synchrotron X-ray science and neutron science to promote synergistic collaborations among these fields.