Symposium F3. Advanced Characterization: TEM
|Ming-Yen Lu ||National Tsing Hua University|
|Shih-Yun Chen|| National Taiwan University of Science and Technology|
|Chih-Yen Chen ||National Sun Yat-sen University|
|Wen-Wei Wu ||National Yang Ming Chiao Tung University|
|Shen-Chuan Lo ||Industrial Technology Research Institute|
Scope & Topics
Transmission electron microscopic analysis is one of the critical analysis techniques for materials science developments. With the rapid developments in aberration correction electron optics, atomic resolution in transmission electron microscopy and spectroscopy is now enabled for investigations of how atomic structures lead to the properties of materials. The symposium offers the attendees a platform for the discussion of the development and applications of microscopy techniques with new imaging, spectroscopy, diffraction, and in-situ techniques. The integration of experiments and computer simulations has been proposed to effectively contribute towards exploring materials design; therefore, the theoretical calculation, simulation, and big data are also included for the discussion.